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The VCC-SXCXP1SWPS camera features a maximum resolution of 21 million pixels and utilizes a CoaXPress interface. It incorporates a 1.3 million resolution, 1/2" global shutter type SWIR sensor, allowing it to inspect the invisible parts of objects within a detection wavelength spectrum ranging from 400 to 1700nm. The VCC-SXCXP1SWPS can capture a maximum of 21M images by employing pixel shifting controlled by a piezo-actuator, making it highly suitable and valuable for various inspection applications.
The VCC-SXCXP1SWPS is particularly well-suited for tasks like wafer inspection, PCB inspection, food and agricultural products inspection, pharmaceutical coating and tablet inspection, classification, and identification, as well as process quality control in factories. Additionally, the VCC-SXCXP1SWPS comes equipped with essential functions for factory automation applications, including external trigger, ROI, defective pixel correction, shading correction, gain, and gamma correction.


  • Global shutter, visible+SWIR sensor
  • Complies with CoaXPress Ver 1.1.1, CXP-3
  • 1 lane
  • Installed pixel-shifting function
  • Exposure and Gain settings
  • External trigger mode (Fixed trigger shutter mode)
  • GenICam complied
  • C mount
  • PoCXP non-compliant
  • 400nm~1700nm detection wavelength spectrum

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Product image of CIS VCC-SXCXP1SWPS
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Product image of  CIS VCC-SXCXP1SWPS

Quick Info for the CIS VCC-SXCXP1SWPS

Camera Series: CXP
Format: 1/2
FPS: 150
Interface: CoaXPress
Manufacturer: CIS
Resolutions: 1.3 MP
Sensor: Sony IMX990
Shutter: Global
Signal System: SWIR
Technology: Area Scan Cameras
Technology: Coaxpress Cameras
Technology: SWIR