Dalsa Genie Nano-CXP Camera

Teledyne Dalsa introduces the Genie Nano-CXP, a CMOS area scan camera.

The Genie Nano-CXP redefines performance. Genie Nano-CXP starts with industry leading image CMOS sensors from 16 to 67 megapixel resolution and adds proven CoaXPress 6Gbps technology for breakthrough speed, a robust build quality for wide operating temperature, and an unmatched feature set.

The Genie Nano-CX Ptakes advantage of leading industrial image sensors from Teledyne E2V and On-Semi, starting with the 25M and 16M monochrome/NIR models, with additional models and series that support advanced camera features in a compact form factor for easy integration.

Download Product PDF:

• Dalsa Genie Nano-CXP Camera

TECHNICAL INFORMATION:

Key Features

• Industry’s latest CMOS image sensors
• Simplified set-up with field proven Sapera LT
• software featuring CamExpert
• Engineered to accommodate industrial environment
• with DIN connectors
• GenICan GenCP compliant

Programmability

• Higher frame rates achievable in partial scan mode
• Global electronic shutter with exposure control
• Multi-ROI feature

Reliability

• Robust all-metal body
• 3 year warranty
• Trigger to Image Reliability (T2IR) framework improves
• the reliability of your inspection system and protects
• you from data loss

Typical Applications

• Semiconductor wafer inspection
   
  • Surface and bump inspection
• Electronics manufacturing
   
  • 3D solder paste inspection
  • Package and bump inspection
  • Automated Optical Inspection (AOI)
•  Solar panel inspection
• General machine vision

Regulatory Compliance

• CE, FCC, RoHS, GenICam, IP30, CoaXPress 1.1
• KC certification

Request a Quote